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Richardson,
Texas (October 9, 2003)
Zyvex Corporation, a leading nanotechnology
company commercializing innovative tools, products and services,
today announced the sales release of the F100
Nanomanipulator System, a positioning and testing tool
for research, development, and production applications using
Focused Ion Beam (FIB) instruments. The product enables users
to manipulate and test semiconductor devices and other materials
in situ, improving the quality and reducing failure
of integrated circuits. The device, which uses microgrippers
to improve sample handling, is useful in nano- and microscale
sample preparation for Transmission Electron Microscopes (TEMs).
The F100 provides three-dimensional
positioners which grasp, move, test, and optimally position
micro- and nanoscale samples. The positioners offer up to
five degrees-of-freedom positioning capability. An easy-to-use
joystick and illuminated keypad provide an unparalleled degree
of control and resolution at the nanoscale.
“The launch of the F100 is
an expansion of our nanomanipulation product line initially
developed in 2002. Our S100
Nanomanipultor is currently used by research and industrial
customers in scanning electron microscopes (SEMs) and with
the Zyvex Optical Docking Station for optical microscopes,”
noted Zyvex’s Chief Operating Officer, Thomas A. Cellucci,
PhD, MBA. “Our platform strategy leverages current microscopy
instrumentation, while setting the stage for a new generation
of microassembly and analysis systems. We feel confident that
this will be a winning product since it has already attracted
significant interest from several FIB equipment manufacturers.”
The F100 is available in both bottom-mount
and top-mount configurations for a variety of FIBS from leading
vendors.
These products are an integral
part of Zyvex’s mission of providing flexible, automated
manufacturing at ever decreasing size scales.
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