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Richardson, Texas (August 4, 2004)
FEI Company (Nasdaq: FEIC), a world leader in
focused ion beam (FIB) technologies, and Zyvex Corporation,
the nanotechnology commercialization leader, have signed an
agreement to provide real-world solutions for electrical/IC
probing applications.
The agreement calls for the companies to share
marketing, sales, and applications engineering resources to
create new solutions that combine Zyvex’s nanomanipulation
and probing technologies with FEI’s expertise in analyzing
nanoscale features in complex semiconductor devices.
The need to probe sub-100 nanometer features
is relatively new to the semiconductor industry. Zyvex’s
NanoWorks™ Product line fulfills that need with nanomanipulation
and probing systems that are compatible with scanning electron
microscopes (SEMs), focused ion beam systems (FIBS), confocal
microscopes, probe stations, and standard upright and inverted
optical microscopes.
“Zyvex is a proven leader in nanotechnology
commercialization, and FEI is a well-known provider of reliable
systems throughout the world,” said Thomas A. Cellucci,
PhD, Zyvex’s President. “Now that we are integrating
our Nanomanipulator and Prober products with FEI’s state-of-the-art
focused ion beam systems, our customers will have with a far
more effective solution than they’ve ever had before.”
FEI’s Tools for Nanotech™ bring
the nanoscale within the reach of researchers and developers
who are working towards the biggest innovations of the 21st
Century.
The combined Zyvex/FEI systems comprise flexible,
cost-effective, modular tools that promote interchangeability
of sample/structure carriers. Combining these with interchangeable
NanoEffector™ tools provides a wide array of experimental
options — whether the aim is to study meso, micro, nano,
or molecular based structures. For more information on the
FEI Company, visit their web site at www.feicompany.com.
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