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Offers 90 and 65 nanometer node probing capabilities
Richardson, Texas (April 2, 2004)
Zyvex Corporation today announced a breakthrough
probing application for integrated circuit (IC) defect analysis.
Zyvex enables rapid-response semiconductor device failure
analysis at the contact level for better, faster, and cheaper
IC development — features that are critical to the highly-competitive
semiconductor industry.
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| Four probe contact on an n-channel MOSFET.
The gate probe is connected to the pass-gate shared by
four n-channel transistors. The Psub probe is connected
to the substrate contact and the S/D probes are connected
to the source and drain of the transistor being tested.
The system is capable of connecting the contacts that
are separated by as little as 70 nanometers and as large
as 10 millimeters. |
Zyvex’s new IC probing application is
targeted directly to the semiconductor industry. Distinguishing
features include: Contact level probing (90 and 65 nanometer
nodes); installation in both scanning electron microscopes
and focused ion beam systems; 5 nanometer movement control;
low contact resistance; stable, accurate IV measurements;
low noise (1pA measurement capability); and a contamination
control system. Zyvex is so confident of its IC probing advantages,
it offers to test customers’ sample devices, present
results, and prove the benefits.
“This new application is targeted at semiconductor
firms looking for a competitive advantage in the development
of next generation chips,” said Zyvex President, Thomas
A. Cellucci, PhD, MBA. “We have leapfrogged the current
competition by offering a solution that's easy to install,
quick to produce results and payback, and enhances the equipment
that companies already have. Global semiconductor firms can’t
afford to be without this application if they want to stay
ahead of the pack.”
An application note entitled “Probing
Transistors at the Contact Level in Integrated Circuits”
is available on the Zyvex web
site. Other available application notes show the power
and versatility of Zyvex's NanoWorks™ Product Line,
NanoEffector™ Tools, and Nanomaterials Products and
Capabilities.
The new IC100 Probing application is an integral
part of Zyvex’s mission of providing flexible, automated
manufacturing at ever decreasing size scales.
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