Zyvex dProber™
The Door-Mountable Solution for the Semicondutor Failure Analysis Industry


• Electrical characterization for device quality or failure analysis
  — 6-point probing
  — 4- point probing
  — Butterfly curves
  — Kelvin probing
  — Contact-level probing
  — Metal 1-level probing
• Nanostructure/nanomaterial/nanointerconnect R&D
• Surface science experiments

Zyvex Home Page
Zyvex News
Zyvex Products
About Zyvex
Contact Zyvex