Zyvex sProber™
The Installable and Removable Solution for the
Semicondutor Failure Analysis Industry

Applications

• Electrical characterization for device quality or failure analysis.
  — 4 point probing.
  — Contact-level probing.
  — Metal 1-level probing.
• Nanostructure/nanomaterial/nanointerconnect R&D.
• Surface science experiments.
• Assembly and manipulation.