Zyvex sProber™
The Installable and Removable Solution for the
Semicondutor Failure Analysis Industry


• Electrical characterization for device quality or failure analysis.
  — 4 point probing.
  — Contact-level probing.
  — Metal 1-level probing.
• Nanostructure/nanomaterial/nanointerconnect R&D.
• Surface science experiments.
• Assembly and manipulation.

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