NanoEffector® Probes
Nanoscale Probes for Zyvex Nanomanipulator Systems

Composite SEM images (taken from the probe shaft to the probe tip). The TP-25’s slender taper angle allows for probing small geometries.

There are two major challenges with probing at the nanoscale: probing small features (50 nm contact) and probing small geometries (four 50 nm contacts within 100 nm of each other). Zyvex’s NanoEffector Probes are designed to overcome both of these challenges. Their tip radius is better than 50 nm and allows for probing of extremely small features. The probes also have a high aspect ratio (length to diameter) which allows up to 8 probe tips within a 500 nm workspace. NanoEffector Probes are the most versatile and reliable probes on the market.

NanoEffector Probes used with the Zyvex S100 to perform four point electrical characterization of a germanium wire.