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The Zyvex S100, part of the NanoWorks®
Tools product line, is a manipulation and testing tool used
with a scanning electron microscope (SEM) or a focused ion
beam (FIB) system for micro- and nanoscale research and development
applications.
The system consists of a state-of-the-art
Zyvex Nanomanipulator, a control cabinet housing the PC and
electronics, a joystick, and Windows based software to control
the system.
The S100 is specifically designed for
research and development labs in universities, national facilities,
and industry. The system is easily installed and removed by
the user allowing the SEM/FIB to be quickly converted between
imaging only and nanoscale manipulation applications. The
system is also flexible enough to work with a wide range of
electrical, mechanical, and other test equipment through the
patch panel on its control cabinet.
The S100 has a coarse mode which provides
controlled cartesian motion over large distances (12 mm of
travel with 100 nm resolution) and a fine mode for extremely
smooth and precise motion (100 microns of travel with 5 nm
resolution) . Zyvex NanoEffector® Probes have a tip radius
of 50 nm or better and a smooth taper to tip that allows multiple
probes within a small area. Each positioner contains 5 I/O
channels, for a total of 20 independent electrical connections
inside the SEM.
The S100 is a versatile tool that is designed
to provide the best possible nanomanipulation platform for
a multitude of applications. Researchers on a budget can design
their own characterization packages to integrate with the
S100 or purchase specific characterization packages from Zyvex.
Our Applications Group is constantly working on new enhancements
for the system in areas like mechanical, electrical, and thermal
characterization.
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