Zyvex nProber™
The Complete Solution for the Semicondutor Failure Analysis Industry


Applications

Electrical characterization for device quality or failure analysis
— 8-point probing
— 6-point probing
— 4-point probing
— Butterfly cuves
— Kelvin probing
— Bitcell stability testing
— Contact-level probing
— Metal 1-level probing
• Nanostructure/nanomaterial/nanointerconnect R&D
• Surface science experiments
• Assembly and basic manipulation at the nanoscale